09:00 - 17:00
CCM Working Group on the Realisation of the Kilogram (CCM WGR-kg)
Birch Room - Executive Level
Chair: Horst Bettin, Physikalisch-Technische Bundesanstalt

09:00 - 17:30
CCEM Working Group on the Electrical Methods to Monitor the Stability of the Kilogram
Oak Room - Executive Level
Chair: Ian Robinson, National Physical Laboratory

16:00 - 17:00
Power and Energy Experts Meeting
Maple Room - Executive Level
Chair: Paul Wright, NPL
Chair: Gert Rietveld, VSL

14:00-15:30
Informal Meeting of the APMP TCEM
Oak Room - Executive Level
Chair: Murray Early, Measurement Standards Laboratory of New Zealand

16:00 - 17:30
CCEM Working Group of Regional Metrology Organisations (WG-RMO)
Birch Room - Executive Level
Chair: Ilya Budovsky, National Meausrement Institute Australia

16:00 - 17:30
Informal EURAMET SCLF meeting
Maple Room - Executive Level
Chair: Jürgen Melcher, PTB

Chair: Alain Rüfenacht, NIST

10:30 - 10:50
Investigations on Extending the Frequency Range of PJVS based AC Voltage Calibrations
Waldemar Guilherme Kuerten Ihlenfeld, INMETRO

10:50 - 11:10
Further Investigation for Piecewise Sampling to Overcome Transient Effect of Staircase Waveform
Yan Yang, National Institute of Metrology

11:10 - 11:30
Stable arbitrrary waveform generator as a transfer standard for ADC calibration
Jaani T Nissila, VTT Technical Research Center of Finland Ltd, Centre for Metrology MIKES

11:30 - 11:50
Characterization of the frequency response of Analog-to-Digital Converters
Javier Diaz De Aguilar, Centro Español de Metrología (CEM)

11:50 - 12:10
Development of high precision voltage dividers and buffer for AC voltage metrology up to 1 MHz
Bjørnar Karlsen, Justervesenet

12:10 - 12:30
Design of delta-sigma feedback loop for quantum voltage digitizer
Jane Ireland, National Physical Laboratory

Chair: Gerald FitzPatrick, NIST

10:30 - 10:50
Power Quality Propagation Measurements in Smart Grids
Paul S Wright, NPL

10:50 - 11:10
Asynchronous phase comparator for characterization of devices and PMU calibrator
Umberto Pogliano, Istituto Nazionale di Ricerca Metrologica - I.N.Ri.M.

11:10 - 11:30
A Reference Merging Unit and Calibration Setup for Sampled Values over Ethernet
Tapio Lehtonen, VTT MIKES Metrology

11:30 - 11:50
Accurate Phase Calibration of PMUs and PMU Calibrators
Gert Rietveld, VSL

11:50 - 12:10
Smart Grid Power Quality and Stability Measurements in Europe
Paul S Wright, NPL

12:10 - 12:30
An Accurate Phase Compensation Algorithm for PMUs
Francisco (F.M.) Messina, Facultad de Ingeniería, Universidad de Buenos Aires, Argentina

Chair: Luciano Brunetti, Istituto Nazionale di Ricerca Metrologica (INRIM)

10:30 - 10:50
Mechanical Aspects in mm-wave Measurements
Markus Zeier, METAS

10:50 - 11:10
Comparative Modeling of Thermal Isolation Section in a Rectangular Waveguide Microcalorimeter
Xiaohai Cui, National Institute of Metrology, China

11:10 - 11:30
V-band Waveguide Microcalorimeter for Millimeter-wave Power Standards
Jae-Yong Kwon, KRISS

11:30 - 11:50
A Nonlinear Verification Device for Nonlinear Vector Network
David A. Humphreys, National Physical Laboratory

11:50 - 12:10
Improvement of Uncertainty Analysis for Waveguide VNA Measurement at Terahertz Frequency
Masahiro Horibe, National Metrology Institute of Japan (NMIJ) National Institute of Advanced Industrial Science and Technology (AIST)

12:10 - 12:30
Establishment of Attenuation Standards of 110 GHz to 170 GHz using a mm-Wave VNA
Anton Widarta, National Metrology Institute of Japan

Chair: Jan-Theodoor Janssen, National Physical Laboratory

14:00 - 14:20
From AC Quantum Voltmeter to Quantum Calibrator
Jinni Lee, Physikalisch- Technische Bundesanstalt

14:20 - 14:40
Simultaneous Double Waveform Synthesis with a Single Programmable Josephson Voltage Standard
Alain Rufenacht, NIST

14:40 - 15:00
Improvement of Leakage Resistance of PJVS for NIST-4 Watt Balance Experiment
Yi-hua Tang, National Institute of Standards and Technology

15:00 - 15:20
Dry cooling of a 10 V programmable Josephson voltage standard array
Michael Starkloff, Supracon AG

15:20 - 15:40
A Differential Programmable Josephson Voltage Standard for Low-voltage Measurement
Honghui Li, National Institute of Metrology

15:40 - 16:00
10 Volt Automated Direct Comparison of Two Cryocooled Programmable Josephson Voltage Standards
Alain Rufenacht, NIST

Chair: Rado Lapuh, Metrology Institute of the Republic of Slovenia

14:00 - 14:20
Reference Micropotentiometer Resistors for Ac-dc Transfer and Phase Error Measurements
Ilya Budovsky, National Meausrement Institute Australia

14:20 - 14:40
The frequency dependence of a 10 nF gas-dielectric capacitor
Luca Callegaro, Istituto Nazionale di Ricerca Metrologica (INRIM)

14:40 - 15:00
An AC-DC Resistor based on a silicon wafer
Kwang Min Yu, Korea Research Institute of Standards and Science (KRISS)

15:00 - 15:20
Uncertainty Evaluation using the Monte-Carlo Method
Hyung-Kew Lee, KRISS

15:20 - 15:40
Traceable DC – 18 GHz Characterization of Coaxial 50 Ω Impedance Standards
Gert Rietveld, VSL

15:40 - 16:00
Impedance measurements up to 13 MHz
François Ziadé, LNE

Chair: Jari Hällström, MIKES Metrology, VTT Technical Research Centre of Finland Ltd

14:00 - 14:20
Ultrastable Low-Noise Current Amplifiers With Extended Range and Improved Accuracy
Dietmar Drung, Physikalisch-Technische Bundesanstalt (PTB)

14:20 - 14:40
A New Generation of Multijunction Thermal Current Converters
Thomas E. Lipe, NIST

14:40 - 15:00
Improvements in the Performance of a Calibration System for Rogowski Coils at High Pulsed Currents
Branislav Djokic, National Research Council of Canada

15:00 - 15:20
Expansion of the Measurement Range of AC Shunt Resistor Standard
Seitaro Kon, AIST, NMIJ

15:20 - 15:40
Development of High Current Shunts of Cage Design with Active Cooling
Věra Nováková Zachovalová, Czech Metrology Institute

15:40 - 16:00
A DCCT-Based 100-A DC Current Source With High Stability
Zhengkun Li, National Institute of Metrology

For detailed poster program, see: https://www.eiseverywhere.com/ehome/cpem2016/Posters/

18:00 - 19:30
Meeting of the Supplementary Comparison EURAMET.EM-S31
Birch Room - Executive Level
Chair: Jürgen Melcher, PTB

Nature never deals off of the bottom of the deck... but she holds all of the aces: The joys of doing precision measurement science
James Faller, The University of Colorado, and the University of Glasgow

Precision Atom Interferometry
Mark Kasevich, Stanford University

Chair: Beat Jeckelmann, Federal Institute of Metrology METAS

10:30 - 10:50
First mass measurements with the NIST-4 watt balance
Darine Haddad, National Institute of Standards and Technology

10:50 - 11:10
The METAS Watt Balance MARK II
Ali L. Eichenberger, METAS

11:10 - 11:30
Noise Reductions in the NRC Watt Balance
Barry M Wood, National Research Council

11:30 - 11:50
The Construction of the New Joule Balance at the NIM
Zhengkun Li, National Institute of Metrology (P. R. China)

11:50 - 12:10
Progress on the BIPM watt balance
Hao Fang, BIPM

12:10 - 12:30
Towards the next generation NPL watt balance
Ian A. Robinson, National Physical Laboratory

Chair: Thomas Nelson, NIST

10:30 - 10:50
Comparison of Two Realisations of a Power Standard
Ilya Budovsky, National Meausrement Institute Australia

10:50 - 11:10
A computer-controlled calibrator for instrument transformer test sets
Christian Mester, Federal Institute of Metrology METAS

11:10 - 11:30
Calibration of Electronic Transformer with Digital Output Based on Synchronous Sampling
Yang Pan, shanghai institute of measurement and testing technology

11:30 - 11:50
Precision Loss Measurement of Reactive Compensation Components by Sampling Voltage and Current
Enrico Mohns, PTB

11:50 - 12:10
An AC Current Transformer Measuring System for Power Frequencies
Enrico Mohns, PTB

12:10 - 12:30
Development of HF Power Source for the Calibration of Electrosurgical Analyzer
Wei Zhao, National Institute of Metrology, China

Chair: Mikko Merimaa, VTT Technical Research Centre of Finland Ltd.

10:30 - 10:50
QPN Limited Stability and BBR Shift Uncertainty of NRC’s Sr+ Atomic Clock
Bin Jian, National Research Council

10:50 - 11:10
Operational Strontium optical lattice clocks
Eva Bookjans, Observatoire de Paris

11:10 - 11:30
Progress toward a new implementation of an In+ optical clock
Ying Li, National Institute of information and communications Technology

11:30 - 11:50
Optical Cryogenic Silicon Resonators
Thomas Legero, Physikalisch-Technische Bundesanstalt

11:50 - 12:10
Sub-Doppler laser spectroscopy of molecular iodine at 578 nm
Takumi Kobayashi, National Metrology Institute of Japan

12:10 - 12:30
Dependence of Scale Factor on Initial Cloud Size for an Atom-Ball Gyroscope
Bruno Pelle, National Institute of Standards and Technology

For detailed poster program, see: https://www.eiseverywhere.com/ehome/cpem2016/Posters/

Chair: Stephane Solve, BIPM

16:00 - 16:20
2 Volt Pulse-Driven Josephson Arbitrary Waveform Synthesizer
Nathan E. Flowers-Jacobs, NIST

16:20 - 16:40
First Metrological Applications of the PTB 1 V Josephson Arbitrary Waveform Synthesizer
Luis Palafox-Gámir, PTB

16:40 - 17:00
Direct Comparison of a Pulse-driven JAWS and a PJVS at 1 Volt
Alain Rufenacht, NIST

17:00 - 17:20
Precision μV-Synthesizer Based on a Pulse-driven Josephson Array
Ralf Behr, Physikalisch-Technische Bundesanstalt

17:20 - 17:40
AC-DC Calibrations With a Pulse-driven AC Josephson Voltage Standard Operated in a Small Cryostat
Helko E. van den Brom, VSL

17:40 - 18:00
Implementation of a Programmable Josephson Voltage Standard in a Zero Boil-off Dewar
Tom J Stewart, Measurement Standards Laboratory of New Zealand

Chair: Luca Callegaro, Istituto Nazionale di Ricerca Metrologica (INRIM)

16:00 - 16:20
Measurement of Time Constant of Four-terminal Resistor Based on Dissipation Factor
Jian Feng, Shanghai Institute of Measurement and Testing Technology

16:20 - 16:40
Improvements on the Design of a Four Terminal-Pair Coaxial Bridge
Gean Geronymo, Inmetro

16:40 - 17:00
Transport Behaviour and Stability of Inductors for International Comparisons
Jürgen Melcher, PTB

17:00 - 17:20
Calibration of a LCR-Meter at Arbitrary Phase Angles using a Fully Automated Impedance Simulator
Frédéric Overney, Federal Institute of Metrology METAS

17:20 - 17:40
Development of a programmable small capacitance standard at LNE
Olivier Thévenot, Laboratoire National de Métrologie et d'Essai (LNE)

Chair: Masahiro Horibe, National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)

16:00 - 16:20
Thermoelectric Power Transfer Standards for V- and W-Band
Rolf H. Judaschke, PTB

16:20 - 16:40
Characterization of high-speed photodetectors using a laser-based vector network analyzer
Paul Struszewski, Physikalisch-Technische Bundesanstalt

16:40 - 17:00
Temperature Control of Waveguide Extenders
Johannes Hoffmann, METAS

17:00 - 17:20
Uncertainty Evaluation of Balanced S Parameter Measurements
François Ziadé, LNE

17:20 - 17:40
Development of Verification Process for On-Wafer Measurement at Millimeter-Wave Frequency
Ryo Sakamaki, National Institute of Advanced Industrial Science and Technology

17:40 - 18:00
CENAM's Primary Standard for Microwave Power up to 18 GHz
Mariano Botello-Perez, CENAM

18:00-18:30

EURAMET EM, DC & Quantum Metrology Experts Meeting
Oak Room - Executive Level
Chair: Jan-Theodoor Janssen, National Physical Laboratory

18:00-19:30

EURAMET TC-EM WGSP Informal Meeting
Oak Room - Executive Level
Chair: Luca Callegaro, Istituto Nazionale di Ricerca Metrologica (INRIM)

Linking the International System of Units to Fundamental Constants
Joachim Ullrich, Physikalisch-Technische Bundesanstalt

Optical atomic clock
Jun Ye, National Institute of Standards and Technology and University of Colorado

Chair: Antti Manninen, VTT Technical Research Centre of Finland Ltd

10:30 - 10:50
Accuracy verification of single-electron pumps with 0.2 ppm uncertainty
Frank Hohls, Physikalisch-Technische Bundesanstalt

10:50 - 11:10
Universality of the tunable-barrier electron pump at the part-per-million level
Stephen P Giblin, National Physical Laboratory

11:10 - 11:30
Robustness of single-electron pumps at sub-ppm level
Frank Hohls, Physikalisch Technische Bundesanstalt

11:30 - 11:50
Robustness of Potential-Profile-Tunable Electron Pump
Myung-Ho Bae, Korea Research Institute of Standards and Science

11:50 - 12:10
Scaling the current from a GHz electron pump using a CCC
Stephen P Giblin, National Physical Laboratory

12:10 - 12:30
Towards a programmable quantum current generator
Wilfrid Poirier, LNE

Chair: Ralf Behr, Physikalisch-Technische Bundesanstalt

10:30 - 10:50
Impedance Bridge Based on Pulse-Driven Josephson Arrays for Arbitrary Impedance Ratios
Stephan Bauer, Physikalisch-Technische Bundesanstalt

10:50 - 11:10
Systematic Error Analysis in a Josephson Impedance Bridge
Thomas Hagen, PTB

11:10 - 11:30
Josephson-Based Full Digital Bridge for High-Accuracy Impedance Comparisons
Frédéric Overney, Federal Institute of Metrology METAS

11:30 - 11:50
A three-arm 4TP digitally-assisted bridge for the comparison of arbitrary impedances
Massimo Ortolano, Politecnico di Torino

11:50 - 12:10
A Digital Four-Terminal Pair Impedance Bridge
Waldemar Guilherme Kuerten Ihlenfeld, INMETRO

12:10 - 12:30
Large Capacitance Measurement System Based on Dual Balance Bridge
You Li, Beijing Orient Institute of Measurement and Test

Chair: Ilya Budovsky, National Measurement Institute Australia

10:30 - 10:50
10 V Transconductance Amplifier for the Comparison of Josephson Standards and Thermal Converters
Ilya Budovsky, National Meausrement Institute Australia

10:50 - 11:10
Low-Voltage AC-DC transfer standards at NMIJ
Hiroyuki Fujiki, National Metrology Institute of Japan

11:10 - 11:30
A Simple Model for the Prediction of AC-DC Difference of Multi-Junction Thermal Converters
Stefan Cular, National Institute of Standards and Technology

11:30 - 11:50
Calibration of Inductive Voltage Dividers at Power Frequencies Using an AC-PJVS
Jimmy Hsu, Center for Measurement Standards (CMS/ITRI)

11:50 - 12:10
Establishing of 1000V Multi-decade Inductive Voltage Divider Standard at NIM
Wei Wang, National Institute of Metrology P.R.China

12:10 - 12:30
Improved Setup for Bridge Standard Calibration up to 5 kHz
Marc Florian Beug, Physikalisch-Technische Bundesanstalt

Chair: Horst Bettin, Physikalisch-Technische Bundesanstalt

14:00 - 14:20
Mass measurement of 28Si-enriched spheres at NMIJ for determination of the Avogadro constant
Shigeki Mizushima, National Metrology Institute of Japan

14:20 - 14:40
Results from the Magnetic Suspension Mass Comparator for Vacuum-to-Air Mass Dissemination
Corey Stambaugh, National Institute of Standards and Technology

14:40 - 15:00
Comparison of two methods for determining the sorption correction for a vacuum-realized kilogram
Patrick J. Abbott, NIST

15:00 - 15:20
Improvements of A Kilogram Level Inertial Mass Measurement Experiment
Zhuang Fu, Tsinghua University

15:20 - 15:40
Piston Guide and Magnet Assembly for the KRISS Watt Balance
Kwang-Cheol Lee, KRISS

15:40 - 16:00
Surface layer analysis of Si spheres both in vacuum and in air by an improved ellipsometer
Kazuaki Fujita, National Metrology Institute of Japan / National Institute of Advanced Industrial Science and Technology

Chair: René David Carranza Lopez Padilla, Centro Nacional de Metrologia

14:00 - 14:20 A Calibration Setup for IEC 61850-9-2 Test Sets
Marco Agustoni, Federal Institute of Metrology (METAS)

14:20 - 14:40 Calibration of 90° Phase Difference Measured by Digital Sampling Method
Jian Feng, Shanghai Institute of Measurement and Testing Technology

14:40 - 15:00 An Electronic Load to Verify Harmonic Emission Compliance
Peter N Davis, National Physical Laboratory

15:00 - 15:20 A Proposal to Establish a System for Calibration of Harmonic Power Analyzers
Hongtao Huang, National Institute of Metrology

15:20 - 15:40 Improvement of Agilent3458a Performances in Wideband Complex Transfer Function Measurement
Domenico Giordano, Istitito Nazionale di Ricerca Metrologica

15:40 - 16:00 Harmonics and Interharmonics Spectral Analysis by ANN
Javier Diaz de Aguilar, Centro Español de Metrología (CEM)

Chair: François Piquemal, LNE

14:00 - 14:20
Convenient graphene-based quantum Hall resistance standards
Wilfrid Poirier, Laboratoire National de métrologie et d'Essais

14:20 - 14:40
Magnetocapacitance and Dissipation Factor of Epitaxial Graphene Hall Bars
Jürgen Schurr, PTB

14:40 - 15:00
Millimeter-sized Graphene Quantum Hall Devices for Resistance Standards
Yanfei Yang, National Institute of Standards and Technology

15:00 - 15:20
Tests of Series Quantum Hall Arrays Based on Epitaxial Graphene
Antti Manninen, VTT Technical Research Centre of Finland Ltd

15:20 - 15:40
Towards a cryogen-free table-top primary resistance standard
Theodoor J.B.M. Janssen, National Physical Laboratory

15:40 - 16:00
AC quantum Hall effect in epitaxial graphene
Felix Lüönd, METAS

For detailed poster program, see: https://www.eiseverywhere.com/ehome/cpem2016/Posters/

Chair: Yi-hua Tang, National Institute of Standards and Technology

08:30 - 08:50
Measurement of Boltzmann Constant Using Superconducting Integrated Circuit
Chiharu Urano, National Institute of Advanced Industrial Science and Technology

08:50 - 09:10
Accuracy of the New Voltage Standard Using Josephson Junctions Cooled to 77 K
Alexander Klushin, Institute for Physics of Microstructures of the Russian Academy of Sciences (IPM RAS)

09:10 - 09:30
Temperature sensitivity coefficients of the BIPM secondary voltage standards
Stephane Solve, BIPM

09:30 - 09:50
Development of a Compact Zener DC Voltage Standard with Detachable Module System
Nobu-hisa Kaneko, National Metrology Institute of Japan (NMIJ)

09:50 - 10:10
Digital Phase Standard of High Accuracy up to the MHz-Range
Waldemar Guilherme Kuerten Ihlenfeld, INMETRO

Chair: Eddy So, National Research Council Canada

08:30 - 08:50
Study on High-Frequency Power Calibration Technology for Electrosurgical Analyzer
Wei Zhao, National Institute of Metrology, China

08:50 - 09:10
Phase Shift Correction of Reference Sampling Multimeter for Electronic Transformer Calibration
Yang Pan, shanghai institute of measurement and testing technology

09:10 - 09:30
Upgrade of Accuracy and Traceability the SP Sampling Wattmeter
Stefan Svensson, SP National Research Inst. of Sweden

09:30 - 09:50
Traceability and On-Site Calibration of the NRC-MSS Depolarization Current Measurements
Refat Ghunem, National Research Council Canada

09:50 - 10:10
Frequency Calibration of MV Voltage Transformer under Actual Waveforms
Gabriella Crotti, INRIM

Chair: Jürgen Melcher, Physikalisch-Technische Bundesanstalt

08:30 - 08:50
Determination of impedance meter nonlinearity with a capacitance build-up method
Faranak Pourdanesh, Istituto Nazionale di Ricerca Metrologica (INRIM); Politecnico di Torino

08:50 - 09:10
The Optimal Hollow Active Auxiliary Electrode and Its Additional Functions Research
Lu Huang, National Institute of Metrology, China

09:10 - 09:30
Evaluation of a Continuously Variable Calculable Capacitor
Yicheng Wang, NIST

09:30 - 09:50
Progress Report on Measuring the von Kiltzing Constant at the BIPM
Pierre Gournay, BIPM

09:50 - 10:10
Progress report on the determination of RK at LNE
Olivier Thévenot, Laboratoire National de métrologie et d'Essais

Chair: Nick Fletcher, BIPM

10:30 - 10:50
Universality test of the quantum Hall effect on topological insulator
Tetsuro Misawa, NMIJ, AIST

10:50 - 11:10
Direct Comparison of Fractional and Integer Quantized Hall Resistances: Status and Perspectives
Franz J. Ahlers, PTB

11:10 - 11:30
Development of 1-MΩ Quantum Hall Array Resistance Standards
Takehiko Oe, NMIJ/AIST

11:30 - 11:50
Investigation of Niobium nanoSQUIDs Based on Nanobridge Junctions
Xueshen Wang, National Institute of Metrology

11:50 - 12:10
A direct DC 10 V comparison between the NIMJ and the BIPM Programmable Josephson Voltage Standards
Stephane Solve, BIPM

12:10 - 12:30
Characterization of High-Stability AC Source Using AC-PJVS
Yasutaka Amagai, National Metrology Institute of Japan

Chair: François Nez, Laboratoire Kastler Brossel/CNRS/UPMC/ENS

10:30 - 10:50
Study of the OP-PTB Link by Carrier-Phase Two-Way Satellite Time and Frequency Transfer
Joseph Achkar, LNE-SYRTE / Observatoire de Paris

10:50 - 11:10
Current Status of Terahertz Frequency Metrology at NICT
Motohiro Kumagai, National Institute of Information and Communications Technology

11:10 - 11:30
NIST on a Chip with Alkali Vapor Cells: Initial Results
John Kitching, NIST

11:30 - 11:50
Iodine Absorption Cells Quality Evaluation
Jan Hrabina, Institute of Scientific Instruments v.v.i., Czech Academy of Sciences

11:50 - 12:10
Laser Refractometer as a Transfer Standard of the Pascal
Patrick Egan, NIST

12:10 - 12:30
Using small mass and force metrology for laser power measurement
Gordon A. Shaw, U.S. National Institute of Standards and Technology (NIST)

Chair: Ron Ginley, NIST

10:30 - 10:50
Comparison between time- and frequency-domain high-frequency device characterizations
Mark Bieler, Physikalisch-Technische Bundesanstalt

10:50 - 11:10
Comparison of Calibration Methods for Multiport VNAs up to 67 GHz
Djamel Allal, Laboratoire National de Métrologie et d’Essais (LNE), Trappes, France

11:10 - 11:30
Quantum Based RF E-field Sensing by Using Two-photon Transition in Rydberg Atoms
Zhenfei Song, National Institute of Metrology (NIM), China

11:30 - 11:50
Measurement Uncertainty of Free Space Antenna Factor for BI-log Antenna Using Amplitude Center
Satoru Kurokawa, National Institute of Advanced Industrial Science and Technology of Japan

11:50 - 12:10
Investigation of Peak Envelope Power Measurements and Uncertainties
YuSong Meng, National Metrology Centre, A*STAR

12:10 - 12:30
A Signal Processing Approach of High-Q Dielectric Resonance Profile Measurements
Brian O'Keefe, Tufts University

12:30 - 15:00
CPEM Executive Committee Meeting
Oak Room - Executive Level
Chair: Dean Jarrett, National Institute of Standards and Technology

18:00 - 19:30
ACQ-PRO Project Meeting
Oak Room - Executive Level
Chair: Javier Diaz de Aguilar, Centro Español de Metrología (CEM)

For detailed poster program, see: https://www.eiseverywhere.com/ehome/cpem2016/Posters/

Chair: Peter Mohr, NIST

16:00 - 16:20
Laser spectroscopy of muonic deuterium : new contribution to the proton puzzle
Nez, François, Laboratoire Kastler Brossel /CNRS/UPMC/ENS

16:20 - 16:40
Improved spectral aberration in Johnson Noise Thermometry
Pollarolo, Alessio, NIST

16:40 - 17:00
High Resolution Spectroscopy of 1S-3S Transition in Hydrogen
Fleurbaey, Hélène, Laboratoire Kastler Brossel / UPMC / CNRS / ENS

17:00 - 17:20
Upgrading the NIST Electrostatic Force Balance
Stirling, Julian, National Institute of Standards and Technology

17:20 - 17:40
An Oscillating Magnet Watt Balance
Ahmadov, Haji, TUBİTAK

17:40 - 18:00
Towards a test of the Weak Equivalence Principle of gravity using anti-hydrogen at CERN
Nez, François, Laboratoire Kastler Brossel /CNRS/UPMC/ENS

Chair: Murray Early, Measurement Standards Laboratory of New Zealand

16:00 - 16:20
Third Generation of Adapted Wheatstone Bridge for High Resistance Measurements at NIST
Shamith U. Payagala, NIST/JQI

16:20 - 16:40
Ultra-High Resistance Measurement Based on Non-Contact Electrostatic Voltmeter
Feipeng Lin, National Institute of Metrology,China

16:40 - 17:00
Development of an AC Current Comparator Based Resistance Measurement System
Waldemar Guilherme Kuerten Ihlenfeld, INMETRO

17:00 - 17:20
Development of 1 Ω and 10 Ω Metal Foil Standard Resistors
Nobu-Hisa Kaneko, NMIJ/AIST

17:20 - 17:40
Evaluation of the Automatic Coaxial Mechanical Scanner for High-Resistance Measurement Use
Takehiko Oe, NMIJ/AIST

17:40 - 18:00
Quantum Hall Resistance Traceability for the NIST-4 Watt Balance
Dean G. Jarrett, National Institute of Standards and Technology

Chair: Po Gyu Park, Korea Research Institute of Standards and Science (KRISS)

16:00 - 16:20
Time-resolved detection of the berry curvature in GaAs nanostructures
Mark Bieler, Physikalisch-Technische Bundesanstalt

16:20 - 16:40
Methods for characterization and minimization of microwave background in cryogenic environment
Janne S. Lehtinen, VTT Technical Research Centre of Finland Ltd

16:40 - 17:00
Analysis of Heat Loss for Measurement of Thomson Coefficient Using AC Calorimetric Method
Yasutaka Amagai, National Metrology Institute of Japan

17:00 - 17:20
Coplanar Capacitive sensor for Measuring Horizontal Displacement in Joule Balance
Yang Bai, Harbin Institute of Technology

17:20 - 17:40
Identification and correction of artefact in the measurement of pulsed magnetic fields
Domenico Giordano, INRIM

17:40 - 18:00
Digital Control of Magnetic Induction Waveform Applied to Silicon Steel Sheets Characterization
Matheus L.P. Pinheiro, Universidade Federal de Goiás

Chair: Michael Stock, BIPM

08:30 - 08:50
The new Kilogram Materialized by Silicon Isotopes
Frank Härtig, Physikalisch-Technische Bundesanstalt

08:50 - 09:10
Realization of the Kilogram Based on the Planck Constant at NMIJ
Naoki Kuramoto, National Institute of Advanced Industrial Science and Technology

09:10 - 09:30
A Two Thickness Interferometer for Lattice Strain Investigations
Enrico Massa, INRIM - Istituto Nazionale di Ricerca Metrologica

09:30 - 09:50
Surface characterization of silicon spheres by combined XRF and XPS analysis
Michael Kolbe, Physikalisch-Technische Bundesanstalt

09:50 - 10:10
Measurement reproducibility of PTB’s sphere interferometer after more than a decade
Arnold Nicolaus, PTB Physikalisch-Technische Bundesanstalt

10:10 - 10:30
Comparison of Mean Diameters of Si-Spheres Measured with both PTB-Sphere Interferometers
Torsten Mai, Physikalisch-Technische Bundesanstalt

Chair: Enrico Mohns, Physikalisch-Technische Bundesanstalt

08:30 - 08:50
A Buildup Method for Determining the Voltage Coefficient of High Voltage Resistors
Harold V. Parks, National Research Council Canada

08:50 - 09:10
Bilateral high voltage AC peak and rms value comparison up to 150 kV between MIKES-VTT and PTB
Jari Hällström, MIKES-VTT

09:10 - 09:30
Voltage Dependence Measurement of a 110 kV LVE-TSVT
Haiming Shao, National Institute of Metrology, China

09:30 - 09:50
Traceability of No-Load Loss Measurements of High Voltage Transmission Lines
Eddy So, National Research Council of Canada

09:50 - 10:10
Research on Quantity Traceability for High Accuracy Two-stage Voltage Transformer
Huanghui Zhang, National Institute of Metrology

10:10 - 10:30
Design and Self-calibration of the RVD with Serial-parallel Connection
Xianlin Pan, NIM

Chair: David Humphreys, National Physical Laboratory

08:30 - 08:50
Estimation of waveform state levels and uncertainties using the histogram and shorth methods
Mark Bieler, Physikalisch-Technische Bundesanstalt

08:50 - 09:10
Permittivity measurements for high-permittivity materials at NMIJ using resonator methods
Yuto Kato, National Institute of Advanced Industrial Science and Technology

09:10 - 09:30
An experimental set-up to compare measurements and simulations in MRI dosimetry
Michele Borsero, INRIM

09:30 - 09:50
Measurement of High-Permittivity Dielectric Characteristics at Microwave and mm-wave
Young-Pyo Hong, Korea Research Institute of Standards and Science

09:50 - 10:10
Leakage Effects in Millimeter-Wave Power Transfer Standards
Rolf H. Judaschke, PTB

10:10 - 10:30
Microwave Radiometry of Blackbody Radiation
Dazhen Gu, National Institute of Standards and Technology

09:00 - 16:00
SIM Electricity and Magnetism Metrology Working Group
Quebec Room (4th Floor)
Chair: Lucas Daniel Di Lillo, Instituto Nacional De Tecnologia Industrial INTI

09:00 - 16:00
CODATA Task Group on Fundamental Constants (TGFC)
Oak Room - Executive Level
Chair: David Newell, NIST